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Event Date: 11th Sept 2025
Event brief description
The SCAT organized an Expert Talk on “Counterfeit IC Detection” to shed light on one of the most critical challenges in the semiconductor and electronics industry. Counterfeit Integrated Circuits (ICs) have posed a serious threat to technology reliability, product safety, and national security. With the growing demand for electronic components across various sectors—such as defense, healthcare, automotive, and consumer electronics—the risk of counterfeit ICs entering the supply chain had significantly increased. These fake or tampered components often led to device malfunctions, financial losses, and potential hazards in mission-critical applications.
The expert session explored advanced techniques used to detect and prevent counterfeit ICs, including electrical testing, physical inspection, chemical analysis, X-ray imaging, and machine learning–based detection methods. The talk also covered emerging research in material analysis, traceability, and the use of blockchain technology to secure the semiconductor supply chain.
Participants gained practical insights into identifying counterfeit components, understanding failure mechanisms, and implementing quality assurance strategies to protect against counterfeit infiltration. The session aimed to provide students, researchers, and industry professionals with a comprehensive understanding of the threat landscape, detection methodologies, and prevention frameworks for counterfeit ICs.
By interacting with the expert, attendees learned about real-world case studies, technological advancements, and future trends in hardware security. The engaging talk encouraged participants to explore careers and research opportunities in semiconductor forensics, hardware security, and electronic supply chain management, ultimately contributing to safer and more trustworthy electronic systems
Event Detailed Description
The School of Computer Applications & Technology (SCAT) organized an Expert Talk on “Counterfeit IC Detection” on 11th septtember,2025 at Seminar Hall, C block . The session featured Dr . Rajat Subhra Chakraborti, Professor & Associate DEAN CSE, IIT Kharagpur, who shared valuable insights into one of the most pressing challenges in today’s semiconductor and electronics industry.
The talk aimed to raise awareness about the growing issue of counterfeit Integrated Circuits (ICs), which pose significant risks to technology reliability, product safety, and national security. With the increasing global demand for electronic components across defense, healthcare, automotive, aerospace, and consumer electronics sectors, the infiltration of counterfeit ICs into the supply chain has become a major concern. Such counterfeit or tampered components can lead to device malfunction, system failure, financial losses, and potential hazards, especially in mission-critical applications.
During the session, the expert provided a comprehensive overview of advanced techniques and methodologies used for detecting and preventing counterfeit ICs. The discussion covered several state-of-the-art approaches, including:
- Electrical and functional testing to identify abnormal behavior in circuit performance.
- Physical inspection and microscopy for detailed structural analysis.
- Chemical and material characterization to detect unauthorized modifications.
- X-ray imaging and tomography for non-destructive internal examination.
- Machine learning–based detection systems for predictive identification of counterfeit components.
The expert also highlighted emerging trends in material traceability, semiconductor forensics, and the application of blockchain technology for ensuring supply chain transparency and component authenticity. Real-world case studies were shared to demonstrate how counterfeit ICs infiltrate the global market and how industries are adopting robust quality assurance frameworks to counter this threat.
The event attracted active participation from students, faculty members, researchers, and industry professionals, who gained a deeper understanding of the threat landscape, detection methodologies, and prevention frameworks for counterfeit ICs. The interactive Q&A session allowed attendees to clarify their doubts and explore practical aspects of implementing security measures in semiconductor manufacturing and supply chain management.
Department Name: Department of Computer Application
Event Outcome
The Expert Talk on “Counterfeit IC Detection”, organized by the School of Computer Applications & Technology (SCAT), proved to be highly informative and impactful. The session successfully achieved its objective of enhancing participants’ understanding of the challenges posed by counterfeit Integrated Circuits (ICs) and the advanced detection and prevention methods employed in the semiconductor industry.
Participants gained hands-on knowledge about modern techniques such as electrical testing, physical inspection, chemical and material analysis, X-ray imaging, and machine learning–based detection systems. The discussion on emerging research areas, including blockchain-enabled supply chain traceability and semiconductor forensics, provided valuable insights into the future of hardware security.
The interactive nature of the session encouraged active engagement and knowledge exchange among students, faculty members, and professionals. Attendees appreciated the expert’s practical examples and real-world case studies, which deepened their understanding of how counterfeit ICs impact technology reliability and product safety.
The event successfully sparked interest among students and researchers to explore careers and research opportunities in the fields of hardware security, semiconductor reliability, and electronic supply chain management Overall, the Expert Talk proved to be an enlightening and impactful session, encouraging participants to pursue research and career opportunities in hardware security, semiconductor reliability, and electronic supply chain management. The event reflected SCAT’s continuous commitment to fostering academic excellence, technological awareness, and innovation, contributing to the development of secure, reliable, and trustworthy electronic systems.